Testing of semi - conducting inorganic materials ; determining the orientation of single crystals by means of x - ray diffraction 无机半导体材料的检验.第1部分:采用x射线衍射现象对
2.
Testing of semi - conducting inorganic materials ; determining the orientation of single crystals by means of optical reflection figure 无机半导体材料的检验.第2部分:采用反射光影法测定单
3.
Testing of materials for semiconductor technology ; determination of the orientation of single crystals by means of laue back scattering 半导体工艺材料的检验.第3部分:采用劳埃反向散射法测